• Demo
• Equipment
• Equipment Manufacturers
» Inspection and Measurement Products
› Defect; Particle; Bump; Contamination Detection, Review or Inspection
› Die Inspection; Die Shear
› Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
› Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
› Line Width; Critical Dimension (CD) Measurement
› Microscopes: Optical Microscopes
› Overlay Measurement
› Resistivity Measurement; 4 point probe; Sheet resistance
› Particle Monitors; Analyzers - Airborne or Liquid
› Wire Bonding Inspection; Test
» Test Equipment
› Optical Test Systems
» Photovoltaic Equipment
› PV Equipment: Integration Automation
› PV Equipment: Inspection and Metrology
• Materials Manufacturers
» Wafers and Substrate
› Compound Semiconductor substrates (GaAs on Silicon; GaN; InP; SiGe, etc.)
› Gallium Arsenide (GaAs); Sapphire Substrates
› Silicon on Insulator (SOI); Silicon on Sapphire (SOS); Silicon Carbide;
• Sub-Systems or Components or Parts
» Sub-systems
› Cameras - Still; CCD; Video and Monitors
› Exposure; Illumination Sources - Laser; Lamp; X-ray and other
• Factory Control and Facilities
» Material Handling Systems
› Robotics; Transfer Systems
• Software
» Manufacturing Operations Software
› Yield Management; Process Control Software
» Simulation, Analysis, Modeling Software
› Simulation; Characterization; Verification Software
› Statistical Analysis; Modeling; Cost of Ownership (CoO) Software
• Manufacturing Services or Consulting (including Those Services or Consulting directly related to Manufacturing)
» Manufacturing Services
› Measurement; Inspection Service
• Business Services Or Consulting (including Those Services or Consulting NOT directly related to Manufacturing)
» Business Services or Consulting
› Sales; Manufacturers Representation or Distributors